Non-destructive MicroCT inspection scanner unit (Zeiss METROTOM MicroCT)

The ZEISS micro-computed tomography (CT) system is a non-destructive inspection platform that produces high-resolution three-dimensional volumetric data, allowing for the internal visualization and analysis of components. This capability enables the detailed assessment of interior structures, including voids, defects, assembly interfaces, and wall thicknesses, while also facilitating precise dimensional measurements without requiring any physical sectioning of the part. The inspection process is instrumental in detecting, identifying, and quantifying internal flaws such as porosity, lack-of-fusion defects, cracks, residual powder, and thin-wall inconsistencies—issues often undetectable by conventional external measurement techniques. By generating comprehensive digital 3D renderings of both external and internal geometries, a process standardized in industrial practices under guidelines like ASTM E1441, systems such as ZEISS's metrology-grade CT scanners can capture, measure, and analyze concealed features like internal channels, lattice structures, and defect locations. This supports critical workflows in process optimization, quality assurance, and part qualification, thereby reducing the risk of scrap and enhancing confidence in the structural integrity of additive manufacturing components.