The Scanning Electron Microscope (SEM)
The scanning electron microscope (SEM) is an important research tool in many areas of science ant technology. Its wide range of magnification, great dept of field and resolution of a few nanometers are unequaled by other forms of microscopy. Secondary electron images are the most frequently obtained images from the SEM. However, the backscattered electron (BSE) image provides important information and in some cases more information that the secondary image. When combined with EDX the analyst can perform an elemental analysis on microscope sections of the material or contaminants that may be present.
The hitachi S-570 is the first scanning electron microscope offering ultra-high resolution with a convential electron source. Due to its large specimen stage and the various automated functions by computer the S-570 is a perfect all-rounder. The Hitachi S-570 is a robust, relatively ease to use instrument capable of imaging a wide range of biological and materials samples. Our S-570 is interfaced with an electron backscatter diffraction (EBD) system and an energy dispersive x-ray ( EDX) analytical system from Tracor Northern. The attainable resolution is 3.5nm, the accelerating voltage can range from 0.5~30kV, the magnification can vary from 20X~200,000X and the electron gun is precentered tungsten hairpin type filament.
The imaging system was upgraded to digital imaging system in 2006.
