All requests for XRD must be submitted to the lab manager, Dr. Wanda Aylward, along with sample submission forms clearly indicating the nature of the samples. As this is an x-ray emitting device, all samples are to be submitted to Wanda for analysis.
This facility can accommodate powders and thin films of solid materials. Powdered samples should be crushed to a fine powder, ca. 10 um, either by hand using a mortar and pestle or by using a mechanical miller/crusher. Approximately 1-2 grams of powder are required to fill a side-loaded mount, which is the best method for mounting samples with preferred orientation issues. Top-loaded mounts are available for smaller volume samples.
Thin films may be deposited on a variety of substrates, most commonly glass or metal slides. Users should contact Wanda to ensure that the thin film samples can be properly mounted in the XRD.
1. Elements of X-Ray Diffraction, B. D. Cullity, Addison-Wesley Publishing, 1978
2. Fundamentals of Powder Diffraction and Structural Characterization of Materials, V. K. Pecharsky and P. Y. Zavalij, Springer, 2005
3. X-Ray Diffraction and the Identification and Analysis of Clay Minerals, D. M. Moore and R. C. Reynolds, Jr. Oxford, 1997
4. The Rietveld Method, R. A. Young, Oxford, 2000