SEM Instrument

JEOL JSM 7100F Scanning Electron Microscope (SEM)

Our JEOL JSM 7100 F SEM is a high vacuum, general purpose SEM equipped with a thermally-assisted Schottky type Field Emission gun offering high resolution secondary electron (SE) and backscatter electron (BSE) imaging. The SEM is also equipped with a Deben Centaurus CL detector for panchromatic CL imaging and a Thermo energy dispersive spectrometer (EDS) for elemental analysis.

The instruments were funded by the Hibernia Development Management Corporation (HMDC), procured by Dr. John Hanchar.