JEOL JXA-8230 Electron Probe Microanalyzer (EPMA)
Our JEOL JXA-8230 SuperProbe is equipped with 5 wavelength dispersive spectrometers (WDS), a Thermo energy dispersive spectrometer (EDS), an xCLent IV cathodoluminescense (CL) spectrometer and W electron gun (with the capability of switching to a LaB6 electron gun, if required). Secondary electron (SE) and backscatter electron (BSE) imaging are both capable on the JXA-8230, providing topographical and compositional images. A reflected light optical microscope is mounted for live viewing of samples.
The lab uses JEOL’s proprietary software but also has a Probe for EPMA software package for projects requiring more advanced data acquisition, automation and analyses.
The instruments were funded by the Hibernia Development Management Corporation (HMDC), procured by Dr. John Hanchar.